Instability of light illumination stress on amorphous In–Ga–Zn–O thin-film transistors
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چکیده
Suehye Park (SID Student Member) Abstract — Amorphous Edward Namkyu Cho Ilgu Yun In–Ga–Zn–O thin-film transistors (TFTs) have attracted increasing attention due to their electrical performance and their potential for use in transparent and flexible devices. Because TFTs are exposed to illumination through red, green, and blue color filters, wavelength-varied light illumination tests are required to ensure stable TFT characteristics. In this paper, the effects of different
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تاریخ انتشار 2013